PHE101 Discrete Wavelength Ellipsometer By Angstrom Advanced, USA
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PHE101 Discrete Wavelength Ellipsometer

PHE101 Discrete Wavelength Ellipsometer

( Negotiable )

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Minimum Order

Localité:

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Prix de commande minimale:

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Commande minimale:

1 Unit

Packaging Detail:

Typically insulated cardboard box

Delivery Time:

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Supplying Ability:

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Payment Type:

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Personne à contacter Mr. Angstrom

95 Mill Street, Stoughton, Massachusetts

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Description

Angstrom Advanced sets the standard in Ellipsometry-bringing the best in ellipsometry technology at the most affordable prices.Angstrom Advanced offers full range of ellipsometers for thin film thickness measurements, optical characterization for refractive index and extinction coefficient analysis (n & k). Our ellipsometers can be used for many different applications and are used in some of the most prestigious laboratories such as MIT, NASA, UC Berkeley, Yale University, Duke University, NIST and many more.

The PHE**1 is the latest discrete wavelength ellipsometer with many new features, such as material library, wide variable angle, a second laser for alignment and a powerful software making the instrument with high accuracy and repetition.
Features                                                                                                                                      
  • Excellent accuracy and repetition
  • Fast rotating analyzer operation.
  • Powerful software with material library
  • Widest variable angle ****0°
  • Auto focus compensates for sample  topography and wafer 'bow' misalignment
  • High stability and reproducibility of measured angle better than 0.*1°
  • Measurement speed is less than 1 sec

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Mr. Angstrom < Angstrom Advanced >

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