$ADX2700 X-ray Diffraction Instrument$

ADX2700 X-ray Diffraction Instrument

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USA

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ADX2700

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(Negotiable) Obtenir le dernier prix

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Commande minimale:

1 Unit

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Insulated wooden crate

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Angstrom Advanced

USA

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95 Mill Street, Stoughton, Massachusetts

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La description

Introduction

ADX2700 Î¸Î¸ Powder Xray Diffraction Instrument is multifunction diffractometer with exceptional analysis speed, reliability and reproducibility. The ADX2700 is a diffraction instrument designed for the challenges of modern materials research. ADX2700 can analyze powders, liquids, thin films, nanomaterials and many other different materials. The ADX2700 can be used for many different applications: Academic, Pharmaceuticals, Chemical & Petrochemical, Material Research, Thin Film Metrology, Nano technology, Food & Cosmetics, Forensics, Mining & Minerals, Metals, Plastics & Polymers, etc.

Features

Computed tomography, Highresolution Xray diffraction, High throughput screening, Inplane diffraction, Crystallite size and microstrain analysis, Microdiffraction, Nonambient diffraction, Pair distribution function analysis, Phase identification, Phase quantification, Reflectivity analysis, Residual stress analysis,
Crystallography, Texture analysis, Transmission, Thin film analysis.

ADXDWZ Combination of Eulerian cradle for stress and texture investigations, Thin film and Quantity Analysis attachment with control and analysis software with alignmentfree feature.Â Â

ADCX sample changer is compact and rugged. Integrated spinning improves particle statistics in polycrystalline sample measurements. Fully automatic alignment. Programmable

Accessories

AHTK 1000 high temperature attachmentÂ
Automated variable temperature stage for Xray diffraction measurements of materials at elevated temperatures (room temperature1200Â°C). The stage may be operated in vacuum. The sample is heated radiantly for reduced heat gradients within the sample. Automated z translation within the stage assures precise sample positioning even in the presence of thermal expansion of the sample.Â
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Â ALTK450 Variable temperature attachmentÂ
Automated variable temperature stage for Xray diffraction measurements of crystal structure (193Â°C450Â°C). The stage can be operated under liquid nitrogen cooling conditions..

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Software

General diffraction data processing: automatic peak search, manual peak search, integral intensity, separation of KÎ±1,Î±2, background remove, pattern smoothing and magnifying, mulriple plot, threedimensional plot and simulation of XRD pattern.

Qualitative Analysis: The data processing software has the search and match function on the base of whole profile and diffraction angle. The whole profile matching procedure employs the designed mode to do the qualitative analysis by reducing the search range from major, minor, to micro phase without indicating the diffraction angle. The diffraction angle matching procedure is based on the peaks position and intensity and usually used for the qualitative analysis of the data with large angle error.
Quantitative Analysis: After the phase composition is determined, the content of each phase could be calculated with the help of RIR or/and the Rietveld refinement (Quantitative Analysis without criterion)
Plot and Export: The data processing software is operated within the Windows interface. The preparing exported pattern could be labeled, zoomed in, zoomed out and also copied and pasted.
Phase identification, structure analysis, Thin film analysis, stress investigation, Texture analysis are all available

Parts and Specifications

Xray Generator	Control mode	1kV/step, 1mA/step controlled by PC
	Rated output power	4 kW
	Tube voltage	1060 kV 1kV continuously adjustable
	Tube current	580 mA continuously adjustable
	Xray tube	Cu, Fe, Co, Cr, Mo et al (2 kW) Focus dimension: 1Ã—10 mm2Â or 0.4Ã—10 mm2
	Stability	â‰¤ 0.0005% Â mains fluctuation
Goniometer	Goniometer	theta(Î¸)/theta(Î¸)
	Diffraction circle semidiameter	285mm
	Scan range of Î¸	3Â° to +160Â°
	Continuous scanning speed	0.00696Â°/min
	Setting speed of angle	1500Â°/min
	Scan mode	Î¸Î¸ or Î¸, Î¸; Continuous or step scanning
	One way repeatability of Î¸	â‰¤ 0.0002Â°
	precision of Î¸d or Î¸s	â‰¤0.005Â°
	Minimal stepping angle	0.0001Â°
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Record Unit Â	Counter	PC or SC
	Maximal CPS	5x10^6 CPS
	Proportion counter energy spectrum resolution	â‰¤ 25%(PC), â‰¤ 50%(SC)
	Detectable high voltage	15002100 continuous tune
	High voltage ofÂ the counterÂ	differential or integral, automatic PHA, dead time emendation
ADXDWZ	System detector stability	â‰¤ 0.01%
	Micro Structure	Micro Structure analysis, +/0.5nm
	MicroDiffraction	Micro sample or area, 2nm19 um
Integrated performance	Dispersion dosage	â‰¤ 1Î¼Sv/h
	Integrated stability of the system	â‰¤ 0.5%
	Dimension	1000 Ã— 800 Ã— 1640 mm

Pays:	USA
N Â° de modÃ¨le:	ADX2700
Prix FOB:	(Negotiable) Obtenir le dernier prix
LocalitÃ©:	-
Prix de commande minimale:	-
Commande minimale:	1 Unit
Packaging Detail:	Insulated wooden crate
Heure de livraison:	-
Capacité de Fournir:	-
Payment Type:	-
Groupe de produits :	-